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DFT
2003
IEEE

81views VLSI» more DFT 2003»

A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment

15 years 11 months ago

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Fengming Zhang, Young-Jun Lee, T. Kane, Luca Schia...

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115

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KBSE
2003
IEEE

99views Software Engineering» more KBSE 2003»

Automated Requirements-based Generation of Test Cases for Product Families

15 years 11 months ago

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Clémentine Nebut, Simon Pickin, Yves Le Tra...

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113

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TAP
2010
Springer

92views Hardware» more TAP 2010»

Generating Regression Unit Tests Using a Combination of Verification and Capture & Replay

15 years 11 months ago

Download www.uni-koblenz.de

Christoph Gladisch, Shmuel S. Tyszberowicz, Bernha...

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103

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DATE
2002
IEEE

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Internet-Based Collaborative Test Generation with MOSCITO

15 years 11 months ago

Download www.pld.ttu.ee

André Schneider, Karl-Heinz Diener, Eero Iv...

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134

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DFT
2002
IEEE

108views VLSI» more DFT 2002»

A Test-Vector Generation Methodology for Crosstalk Noise Faults

15 years 11 months ago

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