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VLSID
1995
IEEE

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An efficient automatic test generation system for path delay faults in combinational circuits

15 years 9 months ago

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Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...

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123

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VLSID
1995
IEEE

107views VLSI» more VLSID 1995»

Functional test generation for non-scan sequential circuits

15 years 9 months ago

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Mandyam-Komar Srinivas, James Jacob, Vishwani D. A...

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131

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DAC
1991
ACM

95views Computer Architecture» more DAC 1991»

A Transitive Closure Based Algorithm for Test Generation

15 years 9 months ago

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Srimat T. Chakradhar, Vishwani D. Agrawal

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133

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ICTAI
1994
IEEE

119views Artificial Intelligence» more ICTAI 1994»

GATTO: An Intelligent Tool for Automatic Test Pattern Generation for Digital Circuits

15 years 9 months ago

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Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...

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132

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ITC
1994
IEEE

136views Hardware» more ITC 1994»

An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms

15 years 9 months ago

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