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ITC
1998
IEEE
95views Hardware» more  ITC 1998»
13 years 12 months ago
Native mode functional test generation for processors with applications to self test and design validation
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
Jian Shen, Jacob A. Abraham
APSEC
1998
IEEE
13 years 12 months ago
An Automatic Test Case Generator Derived from State-Based Testing
This paper describes an automated approach to generating test cases for an object-oriented class. The approach is derived from state-based testing methods and refers to a state ma...
Bor-Yuan Tsai, Simon Stobart, Norman Parrington, I...
DELTA
2008
IEEE
14 years 2 months ago
AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis
Re-using embedded resources for implementing builtin self test mechanisms allows test cost reduction. In this paper we demonstrate how to implement costefficient built-in self tes...
M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre
QSIC
2006
IEEE
14 years 1 months ago
A Test Data Generation Tool for Unit Testing of C Programs
This paper describes a prototype tool, called SimC, which automatically generates test data for unit testing of C programs. The tool symbolically simulates the execution of the gi...
Zhongxing Xu, Jian Zhang
ATAL
2008
Springer
13 years 9 months ago
eCAT: a tool for automating test cases generation and execution in testing multi-agent systems
We introduce eCAT, a tool that supports deriving test cases semi-automatically from goal-based analysis diagrams, generates meaningful test inputs based on agent interaction ontol...
Duy Cu Nguyen, Anna Perini, Paolo Tonella