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ENGL
2007
13 years 7 months ago
2007
— Power consumption has become a crucial concern in Built In Self Test (BIST) due to the switching activity in the circuit under test(CUT). In this paper we present a novel metho...
ISVLSI
2003
IEEE
14 years 1 months ago
2003
IEEE
This paper describes a technique for re-ordering of scan cells to minimize power dissipation that is also capable of reducing the area overhead of the circuit compared to a random...
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
? We give a new recursive rounding linear programming (LP) solution to the problem of N-detect test minimzation. This is a polynomialtime solution that closely approximates the exa...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
In this paper we analyze the test power of SRAM memories and demonstrate that the full functional precharge activity is not necessary during test mode because of the predictable a...
DAC
1997
ACM
13 years 12 months ago
1997
ACM
An ATPG technique is proposed that reduces heat dissipation during testing of sequential circuits that have full-scan. The objective is to permit safe and inexpensive testing of l...