5855 search results - page 2 / 1171 » Test generation and minimization with |
VLSID
2006
IEEE
14 years 1 months ago
2006
IEEE
The main result of this paper, proved as a theorem, is that a lower bound on the number of test vectors that detect each fault at least N times is N
ICTAC
2004
Springer
14 years 1 months ago
2004
Springer
A model-based approach for minimization of test sets for interactive systems is introduced. Test cases are efficiently generated and selected to cover the behavioral model and the ...
ATS
2003
IEEE
14 years 29 days ago
2003
IEEE
Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortuna...
ECAI
2008
Springer
13 years 9 months ago
2008
Springer
This article formalises the dual problem to model-based diagnosis (MBD), i.e., generating tests to isolate multiple simultaneous faults. Using a standard propositional MBD framewo...
ITC
1993
IEEE
13 years 11 months ago
1993
IEEE
ÐPseudoexhaustive testing of a combinational circuit involves applying all possible input patterns to all its individual output cones. The testing ensures detection of all detecta...