5855 search results - page 38 / 1171 » Test generation and minimization with |
SNPD
2008
14 years 18 days ago
2008
This paper presents a single project experiment on the fault revealing capabilities of model-based test sets. The tests are generated from UML statecharts and UML sequence diagram...
JIISIC
2008
14 years 19 days ago
2008
DM
2010
13 years 11 months ago
2010
Let H 2V be a hypergraph on vertex set V . For a positive integer r, we call H r-exact, if any minimal transversal of H intersects any hyperedge of H in at most r vertices. This ...
ATS
2009
IEEE
14 years 6 months ago
2009
IEEE
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-...
VLSID
2002
IEEE
14 years 11 months ago
2002
IEEE
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...