5855 search results - page 38 / 1171 » Test generation and minimization with |
106
click to vote
SNPD
2008
15 years 2 months ago
2008
This paper presents a single project experiment on the fault revealing capabilities of model-based test sets. The tests are generated from UML statecharts and UML sequence diagram...
121
Voted
JIISIC
2008
15 years 2 months ago
2008
86
Voted
DM
2010
15 years 26 days ago
2010
Let H 2V be a hypergraph on vertex set V . For a positive integer r, we call H r-exact, if any minimal transversal of H intersects any hyperedge of H in at most r vertices. This ...
103
Voted
ATS
2009
IEEE
15 years 7 months ago
2009
IEEE
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-...
101
click to vote
VLSID
2002
IEEE
16 years 1 months ago
2002
IEEE
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...