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DFT
2006
IEEE
14 years 1 months ago
2006
IEEE
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
ICCAD
1997
IEEE
13 years 12 months ago
1997
IEEE
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...
QSIC
2003
IEEE
14 years 28 days ago
2003
IEEE
A character string is an important element in programming. A problem that needs further research is how to automatically generate software test data for character strings. This pa...
KBSE
1998
IEEE
13 years 12 months ago
1998
IEEE
We report on GADGET, a new software test generation system that uses combinatorial optimization to obtain condition/decision coverage of C/C++ programs. The GADGET system is fully...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...