112 search results - page 17 / 23 » Test generation in VLSI circuits for crosstalk noise |
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
EURODAC
1994
IEEE
13 years 11 months ago
1994
IEEE
Undetectable shorts may decrease the long term reliability of a circuit, cause intermittent failures, add noise and delay, or increase test pattern generation costs. This paper de...
DFT
2003
IEEE
14 years 28 days ago
2003
IEEE
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths select...
FCCM
2003
IEEE
14 years 28 days ago
2003
IEEE
Two FPGA based implementations of random number generators intended for embedded cryptographic applications are presented. The first is a true random number generator (TRNG) whic...