112 search results - page 4 / 23 » Test generation in VLSI circuits for crosstalk noise |
VLSID
1995
IEEE
13 years 11 months ago
1995
IEEE
VLSID
1995
IEEE
13 years 11 months ago
1995
IEEE
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
Crosstalk noise in the clock network of digital circuits is often detected late in the design cycle, sometimes as late as after first silicon. It is therefore necessary to fix cros...
ITC
2003
IEEE
14 years 27 days ago
2003
IEEE
As technology evolves into the deep sub-micron era, signal integrity problems are growing into a major challenge. An important source of signal integrity problems is the crosstalk...
SBCCI
2004
ACM
14 years 1 months ago
2004
ACM
This paper presents an approach for simulation of mixed analog-digital CMOS integrated circuits, aiming at estimating crosstalk effects due to current pulses drawn from voltage s...