Abstract—Multiple-voltage is an effective dynamic power reduction design technique. Recent research has shown that testing for resistive bridging faults in such designs requires ...
S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Ha...
VLSI placement tools usually work in two steps: First, the cells that have to be placed are roughly spread out over the chip area ignoring disjointness (global placement). Then, i...
This paper presents a hybrid BIST architecture and methods for optimizing it to test systems-on-chip in a cost effective way. The proposed self-test architecture can be implemente...
Gert Jervan, Zebo Peng, Raimund Ubar, Helena Kruus
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
—Localized heating-up creates thermal hotspots across the chip, with the integer register file ranked as the hottest unit in high-performance microprocessors. In this paper, we ...
Shuai Wang, Jie Hu, Sotirios G. Ziavras, Sung Woo ...