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» Test register insertion with minimum hardware cost
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DATE
2009
IEEE
93views Hardware» more  DATE 2009»
14 years 2 months ago
Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing
Abstract—Multiple-voltage is an effective dynamic power reduction design technique. Recent research has shown that testing for resistive bridging faults in such designs requires ...
S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Ha...
ISPD
2004
ACM
189views Hardware» more  ISPD 2004»
14 years 26 days ago
Almost optimum placement legalization by minimum cost flow and dynamic programming
VLSI placement tools usually work in two steps: First, the cells that have to be placed are roughly spread out over the chip area ignoring disjointness (global placement). Then, i...
Ulrich Brenner, Anna Pauli, Jens Vygen
ISQED
2002
IEEE
83views Hardware» more  ISQED 2002»
14 years 11 days ago
A Hybrid BIST Architecture and Its Optimization for SoC Testing
This paper presents a hybrid BIST architecture and methods for optimizing it to test systems-on-chip in a cost effective way. The proposed self-test architecture can be implemente...
Gert Jervan, Zebo Peng, Raimund Ubar, Helena Kruus
VTS
2002
IEEE
113views Hardware» more  VTS 2002»
14 years 10 days ago
LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
Krishna Sekar, Sujit Dey
DATE
2009
IEEE
105views Hardware» more  DATE 2009»
14 years 2 months ago
Exploiting narrow-width values for thermal-aware register file designs
—Localized heating-up creates thermal hotspots across the chip, with the integer register file ranked as the hottest unit in high-performance microprocessors. In this paper, we ...
Shuai Wang, Jie Hu, Sotirios G. Ziavras, Sung Woo ...