Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortuna...
Yuxin Tian, Michael R. Grimaila, Weiping Shi, M. R...
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
Gang Chen, Janusz Rajski, Sudhakar M. Reddy, Irith...
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...