126 search results - page 7 / 26 » Testing Berkeley DB |
CORR
2008
Springer
13 years 6 months ago
2008
Springer
Online monitoring remains an important requirement for a range of microsystems. The solution based on the injection of an actuating test stimulus into the bias structure of active...
VTS
2005
IEEE
14 years 8 days ago
2005
IEEE
This paper presents the design of an on-chip spectrum analyzer. A novel architecture is used to mitigate the problems encountered in trying to implement architectures employed in ...
CRV
2008
IEEE
14 years 1 months ago
2008
IEEE
We propose a ray-based segmentation method for color images. A segment is represented by a centroid and evenlydistributed rays shooting out from it. First, a bottom-up low-level b...
VTS
2005
IEEE
14 years 8 days ago
2005
IEEE
We present three resistive bridging fault models valid for different CMOS technologies. The models are partitioned into a general framework (which is shared by all three models) a...
DAC
1994
ACM
13 years 10 months ago
1994
ACM
We address the problem of obtaining good variable orderings for the BDD representation of a system of interacting finite state machines (FSMs). Orderings are derived from the comm...