This paper investigates retiming and clock skew scheduling for improving the tolerance of synchronous circuits to delay variations. It is shown that when both long and short paths...
An area efficient and robust integrated test core for mixed-signal circuits is described. The core consists of a completely digital implementation, except for a simple reconstructi...
Mohamed Hafed, Nazmy Abaskharoun, Gordon W. Robert...
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
This paper presents a new method for designing test wrappers for embedded cores with multiple clock domains. By exploiting the use of multiple shift frequencies, the proposed meth...
In this paper, complex mixed signal circuits such as SiP or SOC including several ADCs and DACs are considered. A new DFT technique is proposed allowing the test of this complete ...
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, ...