244 search results - page 26 / 49 » Testing Digital Circuits with Constraints |
GLVLSI
2006
IEEE
14 years 3 months ago
2006
IEEE
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
CODES
2005
IEEE
14 years 3 months ago
2005
IEEE
Biochips based on digital microfluidics offer a powerful platform for massively parallel biochemical analysis such as clinical diagnosis and DNA sequencing. Current full-custom de...
ISSTA
2009
ACM
14 years 4 months ago
2009
ACM
Dynamic test generation consists of executing a program while gathering symbolic constraints on inputs from predicates encountered in branch statements, and of using a constraint ...
VTS
2000
IEEE
14 years 2 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
ISCAS
2006
IEEE
14 years 3 months ago
2006
IEEE
—We present an efficient approach for on-chip frequency response measurement, including phase and gain, of analog circuitry in mixed-signal systems. The approach uses direct digi...