244 search results - page 32 / 49 » Testing Digital Circuits with Constraints |
ARC
2008
Springer
13 years 12 months ago
2008
Springer
Over the last years, we have witnessed the increased use of Application-Specific Instruction-Set Processors (ASIPs). These ASIPs are processors that have a customizable instruction...
ISPD
2010
ACM
14 years 4 months ago
2010
ACM
In the nanometer IC design, dummy fill is often performed to improve layout pattern uniformity and the post-CMP quality. However, filling dummies might greatly increase intercon...
ET
2010
13 years 8 months ago
2010
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...
ICCAD
2008
IEEE
14 years 6 months ago
2008
IEEE
We propose a post-placement physical synthesis algorithm that can apply multiple circuit synthesis and placement transforms on a placed circuit to improve the critical path delay ...
FPGA
2004
ACM
14 years 1 months ago
2004
ACM
Field Programmable Gate Arrays (FPGAs) are an increasingly popular choice of platform for the implementation of cryptographic systems. Until recently, designers using FPGAs had le...