244 search results - page 8 / 49 » Testing Digital Circuits with Constraints |
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
When testing delay faults on critical paths, conventional structural test patterns may be applied in functionally-unreachable states, leading to over-testing or under-testing of t...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
Metallic Carbon Nanotubes (CNTs) create source-drain shorts in Carbon Nanotube Field Effect Transistors (CNFETs), causing excessive leakage, degraded noise margin and delay variat...
ET
2000
13 years 8 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
ICCS
2004
Springer
14 years 2 months ago
2004
Springer
Abstract. Multi Expression Programming (MEP) is a Genetic Programming variant that uses linear chromosomes for solution encoding. A unique feature of MEP is its ability of encoding...
ET
2002
13 years 8 months ago
2002
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...