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INEX
2004
Springer
14 years 2 months ago
Reliability Tests for the XCG and inex-2002 Metrics
In this paper we compare the effectiveness scores and system rankings obtained with the inex-2002 metric, the official measure of INEX 2004, and the XCG metrics proposed in [4] an...
Gabriella Kazai, Mounia Lalmas, Arjen P. de Vries
HICSS
2003
IEEE
127views Biometrics» more  HICSS 2003»
14 years 2 months ago
Breeding Software Test Cases with Genetic Algorithms
Donald J. Berndt, John W. Fisher, L. Johnson, J. P...
PTS
2007
102views Hardware» more  PTS 2007»
13 years 10 months ago
Testing and Model-Checking Techniques for Diagnosis
Black-box testing is a popular technique for assessing the quality of a system. However, in case of a test failure, only little information is available to identify the root-cause ...
Maxim Gromov, Tim A. C. Willemse
ICCD
2003
IEEE
89views Hardware» more  ICCD 2003»
14 years 2 months ago
Power-Time Tradeoff in Test Scheduling for SoCs
We present a test scheduling methodology for core-based system-on-chips that allows tradeoff between system power dissipation and overall test time. The basic strategy is to use t...
Mehrdad Nourani, James Chin
DATE
2010
IEEE
120views Hardware» more  DATE 2010»
14 years 2 months ago
Memory testing with a RISC microcontroller
—Many systems are based on embedded microcontrollers. Applications demand for production and Power-On testing, including memory testing. Because low-end microcontrollers may not ...
A. J. van de Goor, Georgi Gaydadjiev, Said Hamdiou...