1610 search results - page 13 / 322 » Testing Patterns |
ASPDAC
2006
ACM
14 years 3 months ago
2006
ACM
- We propose a dynamic test compaction procedure to generate high-quality test patterns for path delay faults. While the proposed procedure generates a compact two-pattern test set...
ATS
1998
IEEE
14 years 2 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
XPU
2004
Springer
14 years 3 months ago
2004
Springer
Abstract. User acceptance testing is finally getting the attention and tool support it deserves. It is imperative that acceptance tests follow the best practices and embody the cri...
EURODAC
1994
IEEE
14 years 2 months ago
1994
IEEE
This paper presents an algorithm for generation of test patterns for strong robust path delay faults, i.e. tests that propagate the fault along a single path and additionally are ...
ICCAD
2000
IEEE
14 years 2 months ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...