1610 search results - page 17 / 322 » Testing Patterns |
DATE
2000
IEEE
14 years 2 months ago
2000
IEEE
This paper describes an efficient error simulator able to analyze functional VHDL descriptions. The proposed simulation environment can be based on commercial VHDL simulators. Al...
ICST
2008
IEEE
14 years 4 months ago
2008
IEEE
Evidence suggests that as software ages the original realizations of design patterns remain in place, and participants in design pattern realizations accumulate “grime” – no...
OOPSLA
2005
Springer
14 years 3 months ago
2005
Springer
There is a critical need for approaches to support software testing. Our research exploits the information described at Architectural Patterns to drive the definition of tests. As...
DATE
2009
IEEE
14 years 4 months ago
2009
IEEE
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
IOLTS
2007
IEEE
14 years 4 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...