1610 search results - page 19 / 322 » Testing Patterns |
CISIS
2010
IEEE
14 years 1 months ago
2010
IEEE
— Production automation systems consist of many entities (like robots and shuttles) that interact in complex ways to provide the overall system functionality like product assembl...
ICCAD
1997
IEEE
14 years 2 months ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
ICSE
2009
IEEE-ACM
13 years 7 months ago
2009
IEEE-ACM
Model driven functional system testing generates test scenarios from behavioural and structural models. In order to autmatically generate tests, conditions such as invariants and ...
FLAIRS
2007
14 years 9 days ago
2007
In this paper we present a novel approach for patternconstrained test case generation. The generation of test cases with known characteristics is usually a non-trivial task. In co...
DDECS
2009
IEEE
14 years 1 months ago
2009
IEEE
Although the Neighborhood Pattern Sensitive Fault (NPSF) model is recognized as a high quality fault model for memory arrays, the excessive test application time cost associated wi...