1610 search results - page 27 / 322 » Testing Patterns |
DATE
2006
IEEE
14 years 4 months ago
2006
IEEE
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...
ACL
2006
13 years 11 months ago
2006
In this paper, we describe a rote extractor that learns patterns for finding semantic relationships in unrestricted text, with new procedures for pattern generalization and scorin...
VTS
2002
IEEE
14 years 2 months ago
2002
IEEE
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...
ICCD
2003
IEEE
14 years 3 months ago
2003
IEEE
We present a test scheduling methodology for core-based system-on-chips that allows tradeoff between system power dissipation and overall test time. The basic strategy is to use t...
VTS
2002
IEEE
14 years 2 months ago
2002
IEEE
We present a test methodology to allow testing high-speed circuits with low-speed ATEs. The basic strategy is adding an interface circuit to partially supply test data, coordinate...