1610 search results - page 39 / 322 » Testing Patterns |
DATE
2005
IEEE
14 years 3 months ago
2005
IEEE
We present a hybrid BIST approach that extracts the most frequently occurring sequences from deterministic test patterns; these extracted sequences are stored on-chip. We use clus...
DAGSTUHL
2004
13 years 11 months ago
2004
Abstract. The starting point of this work is the definition of local pattern detection given in [10] as the unsupervised detection of local regions with anomalously high data densi...
TAICPART
2010
IEEE
13 years 8 months ago
2010
IEEE
We report on how the Wrangler refactoring tool has been used to improve and transform test code for Erlang systems. This has been achieved through the removal of code clones, the i...
DATE
2006
IEEE
14 years 4 months ago
2006
IEEE
— We present a probabilistic fault model that allows any number of gates in an integrated circuit to fail probabilistically. Tests for this fault model, determined using the theo...
DATE
1997
IEEE
14 years 2 months ago
1997
IEEE
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...