1610 search results - page 40 / 322 » Testing Patterns |
ACL
2006
13 years 11 months ago
2006
This paper introduces a method for the semi-automatic generation of grammar test items by applying Natural Language Processing (NLP) techniques. Based on manually-designed pattern...
VTS
1996
IEEE
14 years 2 months ago
1996
IEEE
This paper presents an innovative method for inserting test points in the circuit-under-test to obtain complete fault coverage for a specified set of test patterns. Rather than us...
DATE
2000
IEEE
14 years 2 months ago
2000
IEEE
We describe a method for on-chip generation of weighted test sequences for synchronous sequential circuits. For combinational circuits, three weights, 0, 0.5 and 1, are sufficien...
ISQED
2007
IEEE
14 years 4 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
IJCAI
2003
13 years 11 months ago
2003
Often the most expensive and time-consuming task in building a pattern recognition system is col lecting and accurately labeling training and testing data. In this paper, we exp...