1610 search results - page 42 / 322 » Testing Patterns |
ICPR
2008
IEEE
14 years 4 months ago
2008
IEEE
Mining patterns involving multiple values that are significantly relevant is a difficult but very important problem that crosses many disciplines. Multi-value association patterns...
DATE
2008
IEEE
14 years 4 months ago
2008
IEEE
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...
TVLSI
1998
13 years 9 months ago
1998
Abstract—Pseudoexhaustive testing involves applying all possible input patterns to the individual output cones of a combinational circuit. Based on our new algebraic results, we ...
DATE
2008
IEEE
14 years 4 months ago
2008
IEEE
Low-Cost test methodologies for Systems-on-Chip are increasingly popular. They dictate which features have to be included on-chip and which test procedures have to be adopted in o...
ICCD
2006
IEEE
14 years 7 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...