1610 search results - page 44 / 322 » Testing Patterns |
ITC
2000
IEEE
14 years 1 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
BMCBI
2006
13 years 10 months ago
2006
Background: In gene networks, the timing of significant changes in the expression level of each gene may be the most critical information in time course expression profiles. With ...
AAAI
2010
13 years 10 months ago
2010
The goal of testing is to discriminate between multiple hypotheses about a system--for example, different fault diagnoses--by applying input patterns and verifying or falsifying t...
DATE
2003
IEEE
14 years 3 months ago
2003
IEEE
As the technology is shrinking and the working frequency is going into multi gigahertz range, the issues related to interconnect testing are becoming more dominant. Specifically,...
ASPDAC
2009
ACM
14 years 4 months ago
2009
ACM
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...