1610 search results - page 45 / 322 » Testing Patterns |
ESOP
2004
Springer
14 years 3 months ago
2004
Springer
Pattern matching is an important operation in functional programs. So far, pattern matching has been investigated in the context of structured terms. This paper presents an approac...
ATS
2000
IEEE
14 years 2 months ago
2000
IEEE
Testing of embedded cores is very difficult in SOC (system-on-a-chip), since the core user may not know the gate level implementation of the core, and the controllability and obse...
DATE
1999
IEEE
14 years 2 months ago
1999
IEEE
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
VTS
1999
IEEE
14 years 2 months ago
1999
IEEE
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...
EUSFLAT
2007
13 years 11 months ago
2007
This paper concerns problem of selection of optimal subset of irredundant unconditional diagnostic tests by means of evolutionary approach. The method of correction of features’...