359 search results - page 35 / 72 » Testing Periodicity |
MICRO
2007
IEEE
14 years 2 months ago
2007
IEEE
As silicon process technology scales deeper into the nanometer regime, hardware defects are becoming more common. Such defects are bound to hinder the correct operation of future ...
GECCO
2004
Springer
14 years 2 months ago
2004
Springer
In this paper we examine the effects of single node mutations on trees evolved via genetic programming. The results show that neutral mutations are less likely for nodes nearer th...
HYBRID
2010
Springer
14 years 3 months ago
2010
Springer
Mixture-of-Experts (MoE) systems solve intricate problems by combining results generated independently by multiple computational models (the “experts”). Given an instance of a...
ASC
2011
13 years 3 months ago
2011
A new paradigm for online EH regeneration using Genetic Algorithms (GAs) called Competitive Runtime Reconfiguration (CRR) is developed where performance is assessed based upon a b...
DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...