1554 search results - page 70 / 311 » Testing Polymorphic Behavior |
DATE
2003
IEEE
14 years 1 months ago
2003
IEEE
: Stresses are considered an integral part of any modern industrial DRAM test. This paper describes a novel method to optimize stresses for memory testing, using defect injection a...
DATE
1999
IEEE
14 years 15 days ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
ICCAD
1996
IEEE
14 years 11 days ago
1996
IEEE
This paper presents a tutorial on mixed-signal testing. Our focus is on testing the analog portion of the mixed-signal device, as the digital portion is handled in the usual way. ...
FORTE
1998
13 years 9 months ago
1998
Test generation and execution are often hampered by the large state spaces of the systems involved. In automata (or transition system) based test algorithms, taking advantage of s...
TIT
2002
13 years 7 months ago
2002
Abstract--We adapt methods originally developed in information and coding theory to solve some testing problems. The efficiency of two-stage pool testing of items is characterized ...