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DAC
1997
ACM
14 years 11 days ago
Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...
Oriol Roig, Jordi Cortadella, Marco A. Peña...
DATE
2004
IEEE
174views Hardware» more  DATE 2004»
13 years 12 months ago
Graph-Based Functional Test Program Generation for Pipelined Processors
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has prop...
Prabhat Mishra, Nikil Dutt
IJCAI
2007
13 years 9 months ago
Model-Based Optimization of Testing through Reduction of Stimuli
The paper presents the theoretical foundations and an algorithm to reduce the efforts of testing physical systems. A test is formally described as a set of stimuli (inputs to the ...
Peter Struss
AIS
2004
Springer
13 years 12 months ago
Timed I/O Test Sequences for Discrete Event Model Verification
Abstract. Model verification examines the correctness of a model implementation with respect to a model specification. While being described from model specification, implementatio...
Ki Jung Hong, Tag Gon Kim
AOSD
2011
ACM
13 years 3 months ago
Reducing combinatorics in testing product lines
A Software Product Line (SPL) is a family of programs where each program is defined by a unique combination of features. Testing or checking properties of an SPL is hard as it ma...
Chang Hwan Peter Kim, Don S. Batory, Sarfraz Khurs...