6704 search results - page 36 / 1341 » Testing Scenario-Based Models |
ATS
2000
IEEE
14 years 7 days ago
2000
IEEE
: In this paper a complete analysis of spot defects in industrial SRAMs will be presented. All possible defects are simulated, and the resulting electrical faults are transformed i...
FATES
2006
Springer
13 years 11 months ago
2006
Springer
Abstract. The starting point for Model-Based Testing is an implementation relation that formally defines when a formal model representing the System Under Test conforms to a formal...
VTS
2007
IEEE
14 years 2 months ago
2007
IEEE
We describe estimation of the parameters of a manufacturing test and repair model using data available from that test. The model allows imperfect testing and imperfect repair. The...
ITC
1999
IEEE
14 years 3 days ago
1999
IEEE
Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...
ITNG
2008
IEEE
14 years 2 months ago
2008
IEEE
A method of using Markov chain techniques for combinatorial test case selection is presented. The method can be used for statistical and coverage testing of many software programs...