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GLVLSI
2006
IEEE
95views VLSI» more  GLVLSI 2006»
14 years 3 months ago
Test generation using SAT-based bounded model checking for validation of pipelined processors
Functional verification is one of the major bottlenecks in microprocessor design. Simulation-based techniques are the most widely used form of processor verification. Efficient ...
Heon-Mo Koo, Prabhat Mishra
ICML
2010
IEEE
13 years 10 months ago
Cognitive Models of Test-Item Effects in Human Category Learning
Imagine two identical people receive exactly the same training on how to classify certain objects. Perhaps surprisingly, we show that one can then manipulate them into classifying...
Xiaojin Zhu, Bryan R. Gibson, Kwang-Sung Jun, Timo...
DAC
2011
ACM
12 years 8 months ago
Litmus tests for comparing memory consistency models: how long do they need to be?
Memory consistency litmus tests are small parallel programs that are designed to illustrate subtle differences between memory consistency models by exhibiting different outcomes...
Sela Mador-Haim, Rajeev Alur, Milo M. K. Martin
DATE
2002
IEEE
96views Hardware» more  DATE 2002»
14 years 2 months ago
Modeling Techniques and Tests for Partial Faults in Memory Devices
: It has always been assumed that fault models in memories are sufficiently precise for specifying the faulty behavior. This means that, given a fault model, it should be possible...
Zaid Al-Ars, A. J. van de Goor
GECCO
2005
Springer
113views Optimization» more  GECCO 2005»
14 years 2 months ago
Search-based mutation testing for Simulink models
The efficient and effective generation of test-data from high-level models is of crucial importance in advanced modern software engineering. Empirical studies have shown that muta...
Yuan Zhan, John A. Clark