207 search results - page 13 / 42 » Testing Transition Systems with Input and Output Testers |
VTS
2007
IEEE
14 years 1 months ago
2007
IEEE
: Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are found but, in practice, ...
DDECS
2006
IEEE
14 years 1 months ago
2006
IEEE
: An embedded rectifier-based Built-In-Test (BIT) detection circuit for the RF integrated circuits is proposed in this work, and charge pump rectifier is adopted to transform the R...
ITC
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
CCS
2007
ACM
14 years 1 months ago
2007
ACM
To ameliorate the quality of protection provided by intrusion detection systems (IDS) we strongly need more effective evaluation and testing procedures. Evaluating an IDS against ...
GECCO
2003
Springer
14 years 22 days ago
2003
Springer
Evolutionary Testing (ET) has been shown to be very successful for testing real world applications [10]. The original ET approach focusesonsearching for a high coverage of the test...