306 search results - page 10 / 62 » Testing additive integrality gaps |
DATE
2003
IEEE
14 years 25 days ago
2003
IEEE
: Stresses are considered an integral part of any modern industrial DRAM test. This paper describes a novel method to optimize stresses for memory testing, using defect injection a...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...
ISSRE
2002
IEEE
14 years 14 days ago
2002
IEEE
In this paper, based on software reliability growth models with generalized logistic testing-effort function, we study three optimal resource allocation problems in modular softwa...
TACAS
2010
Springer
13 years 5 months ago
2010
Springer
We introduce JTorX, a tool for model-driven test derivation and execution, based on the ioco theory. This theory, originally presented in [12], has been refined in [13] with test-...
ICCAD
2000
IEEE
13 years 12 months ago
2000
IEEE
Spurred by technology leading to the availability of millions of gates per chip, system-level integration is evolving as a new paradigm, allowing entire systems to be built on a s...