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ICCAD
2009
IEEE
101views Hardware» more  ICCAD 2009»
13 years 5 months ago
Compacting test vector sets via strategic use of implications
As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...
Nuno Alves, Jennifer Dworak, R. Iris Bahar, Kundan...
ICCD
2006
IEEE
131views Hardware» more  ICCD 2006»
14 years 4 months ago
Power-Constrained SOC Test Schedules through Utilization of Functional Buses
— In this paper, we are proposing a core-based test methodology that utilizes the functional bus for test stimuli and response transportation. An efficient algorithm for the gen...
Fawnizu Azmadi Hussin, Tomokazu Yoneda, Alex Orail...
CSSE
2008
IEEE
14 years 2 months ago
Lean Implementations of Software Testing Tools Using XML Representations of Source Codes
—By utilizing XML representations of source programs under test, a new approach is proposed to concisely implement some prototypes for TACCLE, a software testing methodology. The...
Yu Xia Sun, Huo Yan Chen, T. H. Tse
GLVLSI
2008
IEEE
157views VLSI» more  GLVLSI 2008»
14 years 2 months ago
Coverage-driven automatic test generation for uml activity diagrams
Due to the increasing complexity of today’s embedded systems, the analysis and validation of such systems is becoming a major challenge. UML is gradually adopted in the embedded...
Mingsong Chen, Prabhat Mishra, Dhrubajyoti Kalita
EUROGP
2003
Springer
101views Optimization» more  EUROGP 2003»
14 years 1 months ago
An Enhanced Framework for Microprocessor Test-Program Generation
Test programs are fragment of code, but, unlike ordinary application programs, they are not intended to solve a problem, nor to calculate a function. Instead, they are supposed to ...
Fulvio Corno, Giovanni Squillero