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104
Voted
DATE
2002
IEEE
15 years 7 months ago
2002
IEEE
This paper presents an innovative algorithm for the automatic generation of March Tests. The proposed approach is able to generate an optimal March Test for an unconstrained set o...
120
Voted
VTS
2003
IEEE
15 years 8 months ago
2003
IEEE
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...
104
Voted
ATS
2004
IEEE
15 years 6 months ago
2004
IEEE
1 This paper describes a heuristic for system-on-chip test scheduling in an abort-on-fail context, where the test is terminated as soon as a defect is detected. We consider an hybr...
116
Voted
ICST
2010
IEEE
15 years 1 months ago
2010
IEEE
— Testing of graphical user interfaces is important due to its potential to reveal faults in operation and performance of the system under consideration. Most existing test appro...
134
Voted
ICST
2009
IEEE
15 years 11 days ago
2009
IEEE
Measurement and detection of redundancy in test suites attempt to achieve test minimization which in turn can help reduce test maintenance costs, and to also ensure the integrity ...