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DATE
2002
IEEE
77views Hardware» more  DATE 2002»
14 years 24 days ago
An Optimal Algorithm for the Automatic Generation of March Tests
This paper presents an innovative algorithm for the automatic generation of March Tests. The proposed approach is able to generate an optimal March Test for an unconstrained set o...
Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale...
VTS
2003
IEEE
119views Hardware» more  VTS 2003»
14 years 1 months ago
Test Data Compression Using Dictionaries with Fixed-Length Indices
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...
Lei Li, Krishnendu Chakrabarty
ATS
2004
IEEE
93views Hardware» more  ATS 2004»
13 years 11 months ago
Hybrid BIST Test Scheduling Based on Defect Probabilities
1 This paper describes a heuristic for system-on-chip test scheduling in an abort-on-fail context, where the test is terminated as soon as a defect is detected. We consider an hybr...
Zhiyuan He, Gert Jervan, Zebo Peng, Petru Eles
ICST
2010
IEEE
13 years 6 months ago
Fault Detection Likelihood of Test Sequence Length
— Testing of graphical user interfaces is important due to its potential to reveal faults in operation and performance of the system under consideration. Most existing test appro...
Fevzi Belli, Michael Linschulte, Christof J. Budni...
ICST
2009
IEEE
13 years 5 months ago
Test Redundancy Measurement Based on Coverage Information: Evaluations and Lessons Learned
Measurement and detection of redundancy in test suites attempt to achieve test minimization which in turn can help reduce test maintenance costs, and to also ensure the integrity ...
Negar Koochakzadeh, Vahid Garousi, Frank Maurer