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DATE
2006
IEEE
89views Hardware» more  DATE 2006»
14 years 2 months ago
Generation of broadside transition fault test sets that detect four-way bridging faults
Generation of n -detection test sets is typically done for a single fault model. In this work we investigate the generation of n -detection test sets by pairing each fault of a ta...
Irith Pomeranz, Sudhakar M. Reddy
ICRA
2005
IEEE
140views Robotics» more  ICRA 2005»
14 years 1 months ago
Field Testing of the Mars Exploration Rovers Descent Image Motion Estimation System
– The Mars Exploration Rover (MER) Descent Image Motion Estimation System (DIMES) is the first autonomous machine vision system used to safely land a robotics payload on another ...
Andrew Edie Johnson, Reg G. Willson, Jay Goguen, J...
ITC
1997
IEEE
92views Hardware» more  ITC 1997»
14 years 5 days ago
A Novel Functional Test Generation Method for Processors Using Commercial ATPG
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...
Raghuram S. Tupuri, Jacob A. Abraham
FATES
2004
Springer
13 years 11 months ago
Test Generation Based on Symbolic Specifications
Abstract. Classical state-oriented testing approaches are based on simple machine models such as Labelled Transition Systems (LTSs), in which data is represented by concrete values...
Lars Frantzen, Jan Tretmans, Tim A. C. Willemse
AAAI
2010
13 years 9 months ago
Dominance Testing via Model Checking
Dominance testing, the problem of determining whether an outcome is preferred over another, is of fundamental importance in many applications. Hence, there is a need for algorithm...
Ganesh Ram Santhanam, Samik Basu, Vasant Honavar