6941 search results - page 15 / 1389 » Testing as a Certification Approach |
ISCAS
1995
IEEE
13 years 11 months ago
1995
IEEE
: Configurations of adders and registers, which are available in tnany datapaths, can be utilized to generate pattems and to compact test responses. Thispaper unalyzes tlie patiern...
ICST
2010
IEEE
13 years 5 months ago
2010
IEEE
A Feature Model (FM) is a compact representation of all the products of a software product line. The automated extraction of information from FMs is a thriving research topic invo...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
ISPW
2008
IEEE
14 years 1 months ago
2008
IEEE
DATE
2003
IEEE
14 years 25 days ago
2003
IEEE
