6941 search results - page 171 / 1389 » Testing as a Certification Approach |
ITC
2002
IEEE
14 years 28 days ago
2002
IEEE
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacit...
DAC
1994
ACM
14 years 3 days ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
DATE
1997
IEEE
13 years 11 months ago
1997
IEEE
A new method for state justi cation is proposed for sequential circuit test generation. The linear list of states dynamically obtained during the derivation of test vectors is use...
CEAS
2008
Springer
13 years 10 months ago
2008
Springer
The effectiveness of anti-spam techniques is an important question: after all, spam has a real cost to legitimate users in terms of time and resources. The problem is how we deter...
COLING
1996
13 years 9 months ago
1996
This article is concerned with the building of a test data set for assisting the industrial user in machine translation evaluation. The emphasis is laid on the interest of an appr...