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ET
2000
80views more  ET 2000»
13 years 8 months ago
A New Method for Testing Re-Programmable PLAs
: We present a method for obtaining a minimal set of test configurations and their associated set oftest patterns that completely tests re-programmable Programmable Logic Arrays (P...
Charles E. Stroud, James R. Bailey, Johan R. Emmer...
TCAD
2010
102views more  TCAD 2010»
13 years 2 months ago
Functional Test Generation Using Efficient Property Clustering and Learning Techniques
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...
Mingsong Chen, Prabhat Mishra
DAC
2008
ACM
14 years 9 months ago
Functional test selection based on unsupervised support vector analysis
Extensive software-based simulation continues to be the mainstream methodology for functional verification of designs. To optimize the use of limited simulation resources, coverag...
Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Fo...
SIGSOFT
2005
ACM
14 years 8 months ago
CUTE: a concolic unit testing engine for C
In unit testing, a program is decomposed into units which are collections of functions. A part of unit can be tested by generating inputs for a single entry function. The entry fu...
Koushik Sen, Darko Marinov, Gul Agha
VLSID
2009
IEEE
115views VLSI» more  VLSID 2009»
14 years 8 months ago
Efficient Techniques for Directed Test Generation Using Incremental Satisfiability
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
Prabhat Mishra, Mingsong Chen