6941 search results - page 201 / 1389 » Testing as a Certification Approach |
ATS
1998
IEEE
14 years 11 days ago
1998
IEEE
In mixed-mode BIST, deterministic test patterns are generated with on-chip hardware to detect the random-pattern-resistant (r.p.r.) faults that are missed by the pseudo-random pat...
VTS
1996
IEEE
14 years 7 days ago
1996
IEEE
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
AMAST
2006
Springer
13 years 12 months ago
2006
Springer
We propose a methodology based on testing as a framework to capture the interactions of a machine represented in a denotational model and the data it manipulates. Using a duality t...
DATE
2004
IEEE
13 years 12 months ago
2004
IEEE
This paper presents STEPS, an innovative softwarebased approach for testing P1500-compliant SoCs. STEPS is based on the concept that the ATE is not considered as an initiator appl...
EMSOFT
2006
Springer
13 years 11 months ago
2006
Springer
A key problem for effective unit testing is the difficulty of partitioning large software systems into appropriate units that can be tested in isolation. We present an approach th...