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DATE
2005
IEEE
115views Hardware» more  DATE 2005»
14 years 1 months ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt
PASTE
2005
ACM
14 years 1 months ago
An empirical framework for comparing effectiveness of testing and property-based formal analysis
Today, many formal analysis tools are not only used to provide certainty but are also used to debug software systems – a role that has traditional been reserved for testing tool...
Jeremy S. Bradbury, James R. Cordy, Jürgen Di...
SPIN
2005
Springer
14 years 1 months ago
Execution Generated Test Cases: How to Make Systems Code Crash Itself
Abstract. This paper presents a technique that uses code to automatically generate its own test cases at run-time by using a combination of symbolic and concrete (i.e., regular) ex...
Cristian Cadar, Dawson R. Engler
VTS
2003
IEEE
115views Hardware» more  VTS 2003»
14 years 1 months ago
Fault Testing for Reversible Circuits
Irreversible computation necessarily results in energy dissipation due to information loss. While small in comparison to the power consumption of today’s VLSI circuits, if curre...
Ketan N. Patel, John P. Hayes, Igor L. Markov
GLVLSI
2002
IEEE
136views VLSI» more  GLVLSI 2002»
14 years 1 months ago
Test generation for resistive opens in CMOS
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
Arun Krishnamachary, Jacob A. Abraham