6941 search results - page 52 / 1389 » Testing as a Certification Approach |
ICST
2009
IEEE
14 years 2 months ago
2009
IEEE
It is challenging to test applications and functions for which the correct output for arbitrary input cannot be known in advance, e.g. some computational science or machine learni...
SE
2010
13 years 9 months ago
2010
Abstract: Test methodologies for large embedded systems fail to reflect the test process as a whole. Instead, the test process is divided into independent test levels feaifferences...
IJIT
2004
13 years 9 months ago
2004
State-based testing is frequently used in software testing. Test data generation is one of the key issues in software testing. A properly generated test suite may not only locate t...
ICCAD
2008
IEEE
14 years 4 months ago
2008
IEEE
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ...
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...