6941 search results - page 57 / 1389 » Testing as a Certification Approach |
ICCAD
2004
IEEE
14 years 4 months ago
2004
IEEE
— In this paper we investigate an effective approach to construct a linear decompression network in the multiple scan chain architecture. A minimal pin architecture, complemented...
SE
2007
13 years 9 months ago
2007
: Automated test case and test driver generation from a precise behaviour UML model is an emerging approach for software functional validation. This innovative approach for validat...
ICSE
2003
IEEE-ACM
14 years 7 months ago
2003
IEEE-ACM
Software system faults are often caused by unexpected interactions among components. Yet the size of a test suite required to test all possible combinations of interactions can be...
VLSID
2005
IEEE
14 years 8 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
DATE
2008
IEEE
2008
IEEE
State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores
13 years 9 months ago
1 We present a new type of Linear Feedback Shift Registers, State Skip LFSRs. State Skip LFSRs are normal LFSRs with the addition of a small linear circuit, the State Skip circuit,...