11718 search results - page 111 / 2344 » Testing database applications |
112
Voted
DATE
2008
IEEE
15 years 9 months ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
116
Voted
ACSAC
2001
IEEE
15 years 6 months ago
2001
IEEE
We introduce a new method for detecting intrusions based on the temporal behavior of applications. It builds on an existing method of application intrusion detection developed at ...
107
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VTS
2003
IEEE
15 years 8 months ago
2003
IEEE
1 We propose a test resource partitioning and optimization technique for core-based designs. Our technique includes test set selection and test resource floor-planning with the ai...
105
Voted
GI
2004
Springer
15 years 8 months ago
2004
Springer
: This paper provides an overview of a practice-oriented testing approach for code generation tools. The main application area for the testing approach presented here is the testin...
134
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KDD
2006
ACM
16 years 3 months ago
2006
ACM
The problem of assessing the significance of data mining results on high-dimensional 0?1 data sets has been studied extensively in the literature. For problems such as mining freq...