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» Testing embedded-core based system chips
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DATE
2004
IEEE
131views Hardware» more  DATE 2004»
13 years 11 months ago
Efficient Modular Testing of SOCs Using Dual-Speed TAM Architectures
The increasing complexity of system-on-chip (SOC) integrated circuits has spurred the development of versatile automatic test equipment (ATE) that can simultaneously drive differe...
Anuja Sehgal, Krishnendu Chakrabarty
ITC
1998
IEEE
94views Hardware» more  ITC 1998»
13 years 11 months ago
Testing embedded-core based system chips
Advances in semiconductor process and design technology enable the design of complex system chips. Traditional IC design, in which every circuit is designed from scratch and reuse...
Yervant Zorian, Erik Jan Marinissen, Sujit Dey
MTDT
2003
IEEE
100views Hardware» more  MTDT 2003»
14 years 20 days ago
Optimal Spare Utilization in Repairable and Reliable Memory Cores
Advances in System-on-Chip (SoC) technology rely on manufacturing and assembling high-performance system cores for many critical applications. Among these cores, memory occupies t...
Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-...
DATE
2005
IEEE
110views Hardware» more  DATE 2005»
14 years 1 months ago
Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture
The increasing complexity and the short life cycles of embedded systems are pushing the current system-onchip designs towards a rapid increasing on the number of programmable proc...
Alexandre M. Amory, Marcelo Lubaszewski, Fernando ...
TVLSI
2008
105views more  TVLSI 2008»
13 years 7 months ago
Robust Concurrent Online Testing of Network-on-Chip-Based SoCs
Lifetime concerns for complex systems-on-a-chip (SoC) designs due to decreasing levels in reliability motivate the development of solutions to ensure reliable operation. A precurso...
Praveen Bhojwani, Rabi N. Mahapatra