80 search results - page 8 / 16 » Testing embedded-core based system chips |
DFT
2003
IEEE
14 years 1 months ago
2003
IEEE
The implementation of imaging arrays for System-On-a-Chip (SOC) is aided by using faulttolerant light sensors. Fault-tolerant redundancy in an Active Pixel Sensor (APS) is obtaine...
GLVLSI
2008
IEEE
13 years 9 months ago
2008
IEEE
The main contribution of this work is an analytical model for finding the upper bound on the temperature difference among various locations on the die. The proposed model can be u...
DFT
2005
IEEE
14 years 2 months ago
2005
IEEE
We propose a novel system-level error tolerance approach specifically targeted for multimedia compression algorithms. In particular we focus on the motion estimation process perf...
KDD
2000
ACM
14 years 2 days ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
JIPS
2007
13 years 8 months ago
2007
: This paper describes the development of the sensor interface and driver program for a point of care (POC) device. The proposed POC device comprises an ARM9 embedded processor and...