A tunneling-open failure mode is proposed and carefully studied. A circuit with a tunneling open could pass at-speed Boolean tests but fail VLV testing or IDDQ testing. Theoretica...
— Testing non volatile memories for tunnel oxide defects is one of the most important aspects to guarantee cell reliability. Defective tunnel oxide layer in core memory cells can...
As network security is a growing concern, system administrators lock down their networks by closing inbound ports and only allowing outbound communication over selected protocols ...
Existing deployments of wireless sensor networks (WSNs) are often conceived as stand-alone monitoring tools. In this paper, we report instead on a deployment where the WSN is a ke...