1215 search results - page 10 / 243 » Testing in the Distributed Test Architecture: An Extended Ab... |
VLSID
2004
IEEE
14 years 7 months ago
2004
IEEE
IDDQ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. C...
VLSID
2007
IEEE
14 years 7 months ago
2007
IEEE
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...
HICSS
2007
IEEE
14 years 1 months ago
2007
IEEE
This paper presents a test framework to support unit component testing in distributed component-based systems that are built upon component technologies like CORBA, COM/.NET, J2EE...
ICFEM
2010
Springer
13 years 6 months ago
2010
Springer
Abstract. Today’s software systems are becoming increasingly configurable and designed for deployment on a plethora of architectures, ranging from sequential machines via multic...
GECCO
2006
Springer
13 years 11 months ago
2006
Springer
Achieving a high quality and cost-effective tests is a major concern for software buyers and sellers. Using tools and integrating techniques to carry out low cost testing are chal...