Comparison of Effectiveness of Current Ratio and Delta-IDDQ Tests

IDDQ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. Current two test methods that promise to extend the life of IDDQ test are Current Ratio and Delta-IDDQ. Although several studies have been reported on these methods, their effectiveness in detecting defects has not been contrasted. In this work, we compare these two methods using industrial test data.

• Type: Conference
• Year: 2004
• Where: VLSID
• Authors: Sagar S. Sabade, D. M. H. Walker
• Keywords: Computer Architecture, Industrial Test Data, Test Methods, Valuable Test Method, VLSID 2004