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VLSID
2004
IEEE

Comparison of Effectiveness of Current Ratio and Delta-IDDQ Tests

14 years 12 months ago
Comparison of Effectiveness of Current Ratio and Delta-IDDQ Tests
IDDQ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. Current two test methods that promise to extend the life of IDDQ test are Current Ratio and Delta-IDDQ. Although several studies have been reported on these methods, their effectiveness in detecting defects has not been contrasted. In this work, we compare these two methods using industrial test data.
Sagar S. Sabade, D. M. H. Walker
Added 01 Dec 2009
Updated 01 Dec 2009
Type Conference
Year 2004
Where VLSID
Authors Sagar S. Sabade, D. M. H. Walker
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